Liquid crystal display for testing defects of wiring in panel

ABSTRACT

A liquid crystal display capable of testing defects of wiring in panel. The liquid crystal display comprising: a TFT array unit comprising a plurality of gate lines and data lines formed in a matrix shape, having TFT transistors at the intersection of the gate line and the data line; a data pad unit commonly connected to the plurality of data lines, receiving signals for driving the data lines; and a wiring unit for testing defects of data line, connected between the data pad unit and the data line, testing disconnection and short of the data line.

BACKGROUND OF THE INVENTION

[0001] 1. Field of the Invention

[0002] The present invention relates generally to a liquid crystaldisplay and, more particularly, to a liquid crystal display capable oftesting defects of wiring in panel.

[0003] 2. Description of the Prior Art

[0004]FIGS. 1A to 1C are drawings showing a Module structure ofconventional liquid crystal display.

[0005] As shown in the drawings, FIG. 1A comprises a X-PCB 2 forsupplying graphic signals to a panel 1, a Y-PCB 4 for applying TFTdriving signals and a FPC 7 for connecting the PCBs.

[0006] And, FIG. 1B shows a structure that the FPC 7 is removed and FIG.1C shows that the Y-PCB 4 is removed and signals for driving gate driverintegrated circuit IC are applied through wiring in the panel 1.

[0007] Here, panels of each module have different shapes and wiring fordriving gate driver IC is formed on the upper part of array substrate ofpanel.

[0008]FIG. 2 is a drawing showing a conventional method of panel test.Referring to FIG. 2, odd lines of data lines (D1, D2 . . . Dn) areconnected to data odd pad 17 a and even lines of the data lines (D, D2 .. . Dn) are connected to data even pad 17 b. In the same method, gatelines (G1, G2 . . . Gn) are connected to gate odd pad 15 a and gate evenpad 15 b. And, Vcom pad 13 is connected to all pixels of TFT array 11 onpanel and wiring 20 is formed on the corner of upper part of panel 10.

[0009] Then, signals are applied to five resulting pads in order to testwhether a unit pixel is normally operated or not. That is, it ispossible to test short of line and pixel by applying voltage to the gateodd pad 15 a, the gate even pad 15 b, the data odd pad 17 a, the dataeven pad 17 b and the Vcom pad 13.

[0010] However, the conventional liquid crystal display has adisadvantage that it is difficult to test disconnection and short bywiring formed on the upper part of panel and additional device isrequired to test defects of wiring.

SUMMARY OF THE INVENTION

[0011] Therefore, the present invention has been made to solve the aboveproblems and an object of the present invention is to provide a liquidcrystal display for testing defects of wiring in panel capable oftesting disconnection and short of wiring in panel when signals areapplied by connecting data line or gate line or common voltage line inpanel to each pad through wiring formed on the outside of panel in azigzag shape.

[0012] In order to accomplish the above object, the present inventioncomprises: a TFT array unit comprising a plurality of gate lines anddata lines formed in a matrix shape, having TFT transistors at theintersection of the gate line and the data line; a data pad unitcommonly connected to the plurality of data lines, receiving signals fordriving the data line; and a wiring unit for testing defects of dataline connected between the data pad unit and the data line, testingdisconnection and short of the data line.

[0013] The data pad unit comprises a first data pad unit commonlyconnected to the odd data line of the plurality of data lines, receivingsignals for driving the odd data line and a second data pad unitcommonly connected to even data line of the plurality of data lines,receiving signals for driving the even data line.

[0014] The wiring unit for testing defects of data line comprises afirst wiring unit for testing defects of data line connected between thefirst data pad unit and the odd data, testing disconnection and short ofthe odd data line and a second wiring unit for testing defects of dataline connected between the second data pad unit and the even data line,testing disconnection and short of the even data line.

[0015] The first and the second wiring units for testing defects of dataline are formed in a zigzag shape.

[0016] According to another embodiment of the present invention, aliquid crystal display for testing defects of wiring in panel comprises:a TFT array unit comprising a plurality of gate lines and data linesformed in a matrix shape, having TFT transistors at the intersection ofthe gate lines and the data lines; a gate pad unit commonly connected tothe plurality of gate lines, receiving signals for driving the gateline; and a wiring unit for testing defects of gate line connectedbetween the gate pad unit and the gate line, testing disconnection andshort of the gate line.

[0017] The gate pad unit comprises a first gate pad unit commonlyconnected to odd gate line of the plurality of gate lines, receivingsignals for driving the odd gate line and a second gate pad unitcommonly connected to even gate line of the plurality of gate lines,receiving signals for driving the even gate line.

[0018] The wiring unit for testing defects of gate line comprises afirst wiring unit for testing defects of first gate line connectedbetween the first gate pad unit and the odd gate line, testingdisconnection and short of the odd gate line and a second wiring unitfor testing defects of second gate line connected between the secondgate pad and the even gate line, testing disconnection and short of theeven gate line.

[0019] The first and the second wiring units for testing defects of gatelines are formed in a zigzag shape.

[0020] According to still another embodiment of the present invention, aliquid crystal display comprises: a TFT array unit comprising aplurality of gate lines and data lines formed in a matrix shape, havinga TFT transistors on each pixel at the intersection of the gate line andthe data line; a common voltage pad unit for applying common voltage tocommon voltage line connected to each pixel; and a wiring unit fortesting defects of common voltage line connected between the commonvoltage line and the common voltage pad unit, testing disconnection andshort of the common voltage line.

[0021] The common voltage pad unit comprises a first common voltage padunit commonly connected to odd common voltage line of the plurality ofcommon voltage lines, receiving signals for driving the odd commonvoltage line and a second common voltage pad unit commonly connected toeven common voltage line of the plurality of common voltage lines,receiving signals for driving the even common voltage line.

[0022] The wiring unit for testing defects of common voltage linecomprises a first wiring unit for testing defects of common voltageline, connected between the first common voltage pad unit and the oddcommon voltage line, testing disconnection and short of the odd commonvoltage line and a second wiring unit for testing defects of commonvoltage line, connected between the second common voltage pad unit andthe even common voltage line, testing disconnection and short of theeven common voltage line.

[0023] The first and the second wiring units for testing defects ofcommon voltage line are formed in a zigzag shape.

[0024] According to the present invention, it is possible to testdefects of wiring in panel by a conventional panel test method, therebyimproving reliability of panel.

BREIF DESCRIPTION OF THE DRAWINGS

[0025]FIGS. 1A to 1C are drawings showing module structure of generalliquid crystal display.

[0026]FIG. 2 is a drawing showing a conventional panel test method.,

[0027]FIGS. 3A and 3B are block diagrams showing a liquid crystaldisplay for testing defects of wiring in panel according to the presentinvention.

[0028]FIGS. 4A and 4B are drawings showing a method of testingdisconnection and short of wiring in panel according to the presentinvention.

DETAILED DESCRIPTION OF THE INVENTION

[0029] The above objects, and other features and advantages of thepresent invention will become more apparent after reading the followingdetailed description when taken in conjunction with the appendeddrawings.

[0030]FIGS. 3A and 3B are drawings showing a method of testing wiring inpanel according to the present invention.

[0031] Referring to FIG. 3A, a TFT array unit 11 in panel 10 is arrangedwith a plurality of gate lines G₁,G₂ . . . G_(n) and data lines D₁, D₂ .. . D_(n) from the TFT array unit. The odd lines of the gate lines G₁,G₂ . . . G_(n) are connected to a gate odd pad 15 a and the even linesare connected to a gate even pad 15 b. The data lines D₁, D₂ . . . D_(n)are connected to a data odd pad 17 a and a data even pad 17 b. Thezigzag connection wiring 30 a on the upper part of panel 10 is connectedto a first line D1 of the data odd pad 17 a in series.

[0032] Referring to FIG. 3B, a test structure is formed in the samemethod as that in FIG. 3A. However, wiring is formed in a separatedzigzag connection wiring 30 b and then, connected to a first line D₁ ofdata odd pad 17 a and a first line D₂ of data even pad 17 b in series.Therefore, it is possible to test disconnection and short of wiring byapplying signal for the test to data odd pad 17 a and data even pad 17b. When short is generated, TFT of data even line 17 b, whereto signalis not applied, is also operated as well as data odd line 17 a.

[0033]FIGS. 4A and 4B are drawings showing a method of testingdisconnection and short of wiring in panel according to the presentinvention.

[0034] Referring to FIG. 4A, when disconnection is generated betweenwiring of panel, the disconnected wiring is connected to a first line D₁of data odd pad 17 a. Therefore, when signal is applied to the data oddpad 17 a, TFT of the disconnected first line D₁ is not operated and TFTsof other lines D₃, D₅ . . . are normally operated.

[0035]FIG. 4B shows a method of testing defects when short is generatedbetween wiring in panel. Referring to FIG. 4B, the data odd pad 17 a isconnected to wiring connected to data even pad 17 b. Therefore, whensignal is applied to data odd pad 17 a, TFT of second data line D₂ isoperated as well as TFT of the first data line D₁. If the two areoperated at the same time, it is determined that short defects aregenerated.

[0036] Although it is not shown in the drawings, it is possible to testdefects by connecting the same method to gate odd pad 15 a and gate evenpad 15 b and by connecting the zigzag wiring 30 a to the common voltageVcom pad 13 in series.

[0037] As described above, according to the present invention, it ispossible to test defects of wiring in panel by connecting wiring in azigzag shape or by separating and connecting wiring in a zigzag shapeand then, connecting the resultant to the gate pad unit, the data padunit and the common voltage pad unit.

[0038] And, according to the present invention, it is possible to removeFlexible Printed Circuit FPC or Printed Circuit Board PCB, therebyreducing manufacturing cost and the size of product.

[0039] Although the preferred embodiment of this invention has beendisclosed for illustrative purpose, those skilled in the art willappreciate that various modifications, alterations, additions andsubstitutions are possible, without departing from the scope and spiritof the invention.

What is claimed is
 1. A liquid crystal display for testing defects ofwiring in panel, comprising: a TFT array unit comprising a plurality ofgate lines and data lines formed in a matrix shape, having TFTtransistors at the intersection of the gate line and the data line; adata pad unit commonly connected to the plurality of data lines,receiving signals for driving the data lines; and a wiring unit fortesting defects of data line, connected between the data pad unit andthe data line, testing disconnection and short of the data line.
 2. Theliquid crystal display according to claim 1, wherein the data pad unitcomprising a first data pad unit commonly connected between odd datalines of the plurality of data lines, receiving signals for driving theodd data lines and a second data pad unit commonly connected betweeneven data lines of the plurality of data lines, receiving signals fordriving the even data line.
 3. The liquid crystal display according toclaim 2, wherein the wiring unit for testing defects of data linecomprises a first wiring unit for testing defects of data line connectedbetween the first data pad unit and the odd data line, testingdisconnection and short of the odd data line and a second wiring unitfor testing defects of data line connected between the second data pdunit and the even data line, testing disconnection and short of the evendata line.
 4. The liquid crystal display according to claim 3, whereinthe first and the second wiring units for testing defects of data lineare formed in a zigzag shape.
 5. The liquid crystal display for testingdefects of wiring in panel comprising: a TFT array unit comprising aplurality of gate lines and data lines formed in a matrix shape, havingTFT transistors at the intersection of the gate line and the data line;a gate pad unit commonly connected between the plurality of gate lines,receiving signals for driving the gate line; and a wiring unit fortesting defects of gate line connected between the gate pad unit and thegate line, testing disconnection and short of the gate line.
 6. Theliquid crystal display according to claim 5, wherein the gate pad unitcomprises a first gate pad unit commonly connected between odd gatelines of the plurality of gate lines, receiving signals for driving theodd gate line and a second gate pad unit commonly connected between evengate lines of the plurality of gate lines, receiving signals for drivingthe even gate line.
 7. The liquid crystal display according to claim 6,wherein the wiring unit for testing defects of gate line comprises afirst wiring unit for testing defects of gate line connected between thefirst gate pad unit and the odd gate line, testing disconnection andshort of the odd gate line and a second wiring unit for testing defectsof gate line connected between the second gate pad unit and the evengate line, testing disconnection and short of the even gate line.
 8. Theliquid crystal display according to claim 7, wherein the first and thesecond wiring units for testing defects of gate line are formed in azigzag shape.
 9. A liquid crystal display for testing defects of wiringin panel comprising: a TFT array unit comprising a plurality of gatelines and data lines formed in a matrix shape, having TFT transistors ineach pixel at the intersection of the gate line and the data line; acommon voltage pad unit for applying common voltage to common voltageline connected to each pixel; and a wiring unit for testing defects ofcommon voltage line connected between the common voltage line and thecommon voltage pad unit, testing disconnection and short of the commonvoltage line.
 10. The liquid crystal display according to claim 9,wherein the common voltage pad unit comprises a first common voltage padunit commonly connected between odd common voltage line of the pluralityof common voltage lines, receiving signals for driving the odd commonvoltage line and a second common voltage pad unit commonly connectedbetween even common voltage lines of the plurality of common voltagelines, receiving signals for driving the even common voltage line. 11.The liquid crystal display according to claim 10, wherein the wiringunit for testing defects of common voltage line comprises a first wiringunit for testing defects of common voltage line connected between thefirst common voltage pad unit and the odd common voltage line, testingdisconnection and short of the odd common voltage line and a secondwiring unit for testing defects of common voltage line connected betweenthe second common voltage pad unit and the even common voltage line,testing disconnection and short of the even common voltage line.
 12. Theliquid crystal display according to claim 11, wherein the first and thesecond wiring units for testing defects of common voltage line areformed in a zigzag shape.